µþö³¦°ì±ð°ù
Kap. 5 'Contribution of the Numerical Approach to Kelvin Probe Force Microscopy on the Atomic-Scale' Laurent Nony, Franck Bocquet, Adam S. Foster, and Christian Loppacher in 'Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces' Sascha Sadewasser and Thilo Glatzel eds. Springer Series in Surface Sciences 48 (2012)
Ö±¹±ð°ù²õ¾±°ì³Ù²õ²¹°ù³Ù¾±°ì±ô²¹°ù
Recent Trends in Surface Characterization and Chemistry with High Resolution Scanning Force Methods - C. Barth, A. S. Foster, C. R. Henry and A. L. Shluger
- Adv. Mater. 23 (2011) 477: